Company Filing History:
Years Active: 2007-2013
Title: The Innovative Mind of Mayuka Oosaki
Introduction
Mayuka Oosaki is a prominent inventor based in Yokohama, Japan, known for her remarkable contributions to technology and engineering. With a total of 11 patents to her name, she has played a vital role in advancing the field of scanning electron microscopy and image measurement for semiconductor devices.
Latest Patents
Among her latest patents is a "Tool-to-tool matching control method and its system for scanning electron microscope." This innovative system addresses the tool-to-tool disparity between multiple scanning electron microscopes. It includes a measuring unit that quantifies the tool-to-tool disparity using secondary electron images, alongside a monitoring unit that tracks the tool states of each microscope. The output unit then presents the relationship between the disparities and the monitored tool states on a visual display.
Another significant patent of hers is the "Charged particle beam apparatus and methods for capturing images using the same." This invention is designed to measure micro-dimensions (critical dimension values) of semiconductor devices. It utilizes a sample with a series of polyhedral structural objects, calibrated to improve beam landing angle consistency, thereby minimizing variations and instrumental errors during measurements.
Career Highlights
Mayuka Oosaki's career has been marked by her work at Hitachi High Technologies Corporation, where she has contributed significantly to technological advancements in electron microscopy. Her dedication to precision and innovation has earned her recognition in the scientific community.
Collaborations
Throughout her career, Oosaki has collaborated with talented individuals, including coworkers Hiroki Kawada and Chie Shishido. Together, they contribute their expertise to tackle complex challenges in the realm of imaging and measurement technology.
Conclusion
Mayuka Oosaki exemplifies the spirit of innovation through her cutting-edge patents and collaborative efforts in research. Her work at Hitachi High Technologies Corporation underscores her commitment to enhancing technological capabilities, particularly in the field of semiconductor measurement and scanning electron microscopy. As she continues to push the boundaries of science and engineering, her contributions will undoubtedly pave the way for future advancements.