Haifa, Israel

Maxim Khokhlov

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Kla Tencor Corporation. Active years: 2016-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maxim Khokhlov. Retrieved from https://idiyas.com/inventor/maxim-khokhlov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 22.0

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2016-2019

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2 patents (USPTO):Explore Patents

Title: Maxim Khokhlov: Innovator in Optical Metrology

Introduction

Maxim Khokhlov is a notable inventor based in Haifa, Israel. He has made significant contributions to the field of optical metrology, holding a total of 2 patents. His work focuses on systems that enhance the precision and effectiveness of measurement techniques.

Latest Patents

Khokhlov's latest patents include innovative systems for providing illumination in optical metrology. One of his patents describes a system designed to combine illumination beams from multiple sources. This system delivers illumination at selected wavelengths to a measurement head, allowing for controlled intensity and spatial coherence. Another patent also focuses on similar systems, emphasizing the delivery of illumination from a broadband source that provides a continuous range of wavelengths. These advancements are crucial for improving measurement accuracy in optical applications.

Career Highlights

Maxim Khokhlov is currently associated with Kla Tencor Corporation, where he applies his expertise in optical metrology. His work at the company has been instrumental in developing advanced measurement technologies that benefit various industries.

Collaborations

Throughout his career, Khokhlov has collaborated with esteemed colleagues such as Gregory Brady and Andrei V Shchegrov. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Maxim Khokhlov is a prominent figure in the realm of optical metrology, with a focus on enhancing measurement systems through innovative illumination techniques. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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