This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Mitutoyo Corporation. Active years: 2016-2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016-2017
Title: Matthew Raymond Dockrey: Innovator in Dimensional Metrology
Introduction
Matthew Raymond Dockrey is a notable inventor based in Seattle, WA. He has made significant contributions to the field of dimensional metrology, holding a total of 2 patents. His work focuses on enhancing measurement technologies, particularly in personal area networks.
Latest Patents
Dockrey's latest patents include a "Remote display device for use in a metrology personal area network." This innovative device is designed to display real-time measurement values and can operate in two modes: a slave mode, where it responds to control instructions from a user interface, and an independent mode, where it displays values autonomously. Another significant patent is the "Method for validating a workpiece measurement in a dimensional metrology hand tool." This method involves using vibration signatures to ensure accurate measurements, enhancing the reliability of hand-held metrology tools.
Career Highlights
Matthew Dockrey is currently employed at Mitutoyo Corporation, a leading company in precision measurement instruments. His role involves developing advanced metrology solutions that improve measurement accuracy and efficiency. His expertise in dimensional metrology has positioned him as a key player in the industry.
Collaborations
Dockrey has collaborated with notable colleagues, including Casey Edward Emtman and Eric T Noble. These partnerships have fostered innovation and contributed to the development of cutting-edge measurement technologies.
Conclusion
Matthew Raymond Dockrey's contributions to dimensional metrology through his patents and work at Mitutoyo Corporation highlight his role as an influential inventor in the field. His innovative solutions continue to advance measurement technologies, ensuring greater accuracy and reliability in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
