The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Sep. 03, 2013
Applicant:

Mitutoyo Corporation, Kawasaki-shi, Kanagawa-ken, JP;

Inventors:

Matthew Raymond Dockrey, Seattle, WA (US);

Casey Edward Emtman, Kirkland, WA (US);

Assignee:

Mitutoyo Corporation, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/18 (2006.01); G01B 21/04 (2006.01); G01B 3/20 (2006.01);
U.S. Cl.
CPC ...
G01B 3/18 (2013.01); G01B 3/205 (2013.01); G01B 21/04 (2013.01);
Abstract

A method for validating a workpiece measurement in a hand-held spatial dimension measurement metrology tool comprises vibrating a portion of the metrology hand tool using the vibration excitation element; sensing a vibration signature using the vibration sensor configuration; identifying a valid contact state between the metrology hand tool and the workpiece based on a vibration signature criterion; identifying a valid seating state based on a measurement stability criterion applied to a set of dimensional measurements of the metrology hand tool; and indicating that a dimensional measurement is valid for a dimensional measurement that is obtained when the valid contact state and the valid seating state occur simultaneously.


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