The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Mar. 22, 2016
Mitutoyo Corporation, Kanagawa-ken, JP;
Matthew Raymond Dockrey, Seattle, WA (US);
Casey Edward Emtman, Kirkland, WA (US);
Eric T. Noble, Gig Harbor, WA (US);
Darren Wayne Robinson, Bothell, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A remote display device for displaying real time measurement values is configured to operate as a device in a metrology personal area network ('MPAN') which also includes a dimensional metrology user interface device and one or more dimensional metrology measurement devices (e.g., calipers, etc.). In various implementations, the remote display device is configured to be operable in either a first mode (e.g., a slave mode) or a second mode (e.g., an independent mode). In a slave mode, the remote display device is responsive to control instructions that are received from the dimensional metrology user interface device to configure a display of real time measurement values from one or more of the measurement devices. In an independent mode, the remote display device is configurable to display real time measurement values from one or more of the measurement devices without receiving control instructions from the dimensional metrology user interface device.