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For the Inventor, By the Inventor

Tokyo, Japan

Masayuki Kuribara

This inventor holds 10 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1996-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masayuki Kuribara. Retrieved from https://idiyas.com/inventor/masayuki-kuribara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10

% Patents Active = 90.0

Average Co-Inventor Count = 1.7

ph-index = 3

Forward Citations = 37(Granted Patents)


Location History:

  • Gyoda, JP (1996 - 1997)
  • Tokyo, JP (2001 - 2013)

Company Filing History:

goldMedal10 out of 2,281 
 
Adv Antest Corporation
 patents

Years Active: 1996-2013

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10 patents (USPTO):Explore Patents
1. 8530836 - Electron-beam dimension measuring apparatus and electron-beam dimension measuring method (2013-09-10),
2. 7663103 - Line-width measurement adjusting method and scanning electron microscope (2010-02-16),
3. 7560693 - Electron-beam size measuring apparatus and size measuring method with electron beams (2009-07-14),
4. 7262410 - Sample observing apparatus and sample observing method (2007-08-28),
5. 6445197 - Electron beam tester, recording medium therefor and signal data detecting method (2002-09-03),
6. 6326798 - Electric beam tester and image processing apparatus (2001-12-04),
7. 5633595 - IC analysis system and electron beam probe system and fault isolation (1997-05-27),
8. 5592099 - IC tester joined with ion beam tester and the detection method of the (1997-01-07),
9. 5589780 - IC Analysis system and electron beam probe system and fault isolation (1996-12-31),
10. 5528156 - IC analysis system and electron beam probe system and fault isolation (1996-06-18),

Title: Masayuki Kuribara: Innovator in Electron-Beam Measurement Technologies

Introduction

Masayuki Kuribara is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electron-beam measurement technologies, holding a total of 10 patents. His innovative work has advanced the precision and efficiency of measurement techniques in various applications.

Latest Patents

Kuribara's latest patents include an electron-beam dimension measuring apparatus and an electron-beam dimension measuring method. The apparatus features electron-beam irradiating means that direct an electron beam onto a sample's surface. It also includes a stage for placing the sample, a photoelectron generating electrode, and ultraviolet light irradiating means. The control means in the apparatus ensures that the electric potential on the sample's surface is maintained at 0 V, allowing for accurate dimension measurement. Another notable patent is a line-width measurement adjusting method used in scanning electron microscopes. This method adjusts the second electron beam intensity distribution to match the first, enhancing measurement accuracy.

Career Highlights

Masayuki Kuribara is currently employed at Adv Antest Corporation, where he continues to develop innovative measurement technologies. His work has been instrumental in improving the capabilities of electron-beam measurement systems.

Collaborations

Throughout his career, Kuribara has collaborated with notable colleagues, including Koshi Ueda and Akira Goishi. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Masayuki Kuribara's contributions to electron-beam measurement technologies have established him as a leading inventor in his field. His patents reflect a commitment to advancing measurement precision and efficiency, making a lasting impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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