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Masayuki Kuribara

USPTO Granted Patents = 10

Average Co-Inventor Count = 1.7

ph-index = 3

Forward Citations = 37(Granted Patents)

Location History:

Gyoda, JP (1996 - 1997)
Tokyo, JP (2001 - 2013)

Company Filing History:

10 out of 2,253

Adv Antest Corporation

Years Active: 1996-2013

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10 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8530836 - Electron-beam dimension measuring apparatus and electron-beam dimension measuring method (2013-09-10),

2. 7663103 - Line-width measurement adjusting method and scanning electron microscope (2010-02-16),

3. 7560693 - Electron-beam size measuring apparatus and size measuring method with electron beams (2009-07-14),

4. 7262410 - Sample observing apparatus and sample observing method (2007-08-28),

5. 6445197 - Electron beam tester, recording medium therefor and signal data detecting method (2002-09-03),

6. 6326798 - Electric beam tester and image processing apparatus (2001-12-04),

7. 5633595 - IC analysis system and electron beam probe system and fault isolation (1997-05-27),

8. 5592099 - IC tester joined with ion beam tester and the detection method of the (1997-01-07),

9. 5589780 - IC Analysis system and electron beam probe system and fault isolation (1996-12-31),

10. 5528156 - IC analysis system and electron beam probe system and fault isolation (1996-06-18),

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