IDiyas

For the Inventor, By the Inventor

Yokohama, Japan

Masakazu Hayashi

USPTO Granted Patents = 5

Average Co-Inventor Count = 1.4

ph-index = 3

Forward Citations = 109(Granted Patents)


Location History:

  • Yokohama, JP (1985 - 2008)
  • Ebina, JP (2012)

Company Filing History:

goldMedal4 out of 52,711 
 
Kabushiki Kaisha Toshiba
 patents
silverMedal1 out of 174 
 
Shibaura Mechatronics Corporation
 patents
bronzeMedal1 out of 2,916 
 
Tokyo Shibaura Denki Kabushiki Kaisha
 patents
where one patent can have more than one assignee

Years Active: 1985-2012

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5 patents (USPTO):Explore Patents
1. 8104385 - Brittle workpiece splitting system and brittle workpiece splitting method (2012-01-31),
2. 7321232 - Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam (2008-01-22),
3. 7009411 - Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam (2006-03-07),
4. 4914293 - Microscope apparatus (1990-04-03),
5. 4554580 - Image information output apparatus (1985-11-19),
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