Company Filing History:
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Years Active: 2000-2008
Title: Masaaki Mochiduki: Innovator in Memory Device Testing
Introduction
Masaaki Mochiduki is a notable inventor based in Honjo, Japan. He has made significant contributions to the field of memory device testing, holding 2 patents that showcase his innovative approaches. His work focuses on improving the efficiency and accuracy of testing memory devices under quasi-operating conditions.
Latest Patents
Mochiduki's latest patents include a "Method and apparatus for testing a memory device in quasi-operating conditions." This invention describes a memory test system that utilizes a personal computer (PC) to screen test objects accurately and cost-effectively. The system comprises a measurement PC unit, a signal distribution unit, multiple performance boards (PFBs), a display panel, a power source, and a control PC. This setup allows for testing individual memories on a memory module in quasi-operating conditions.
Another significant patent is the "IC testing apparatus and method." This invention involves a main tester unit that tests an integrated circuit (IC) device for defects at various addresses under predetermined conditions. The results are stored in a first memory, and a curing analysis processing section addresses defective areas by rearranging the address logic. This innovative approach enables effective defect analysis during mass production.
Career Highlights
Masaaki Mochiduki has worked with prominent companies in the technology sector, including Hitachi Electronics Engineering Co., Ltd. and Renesas Technology Corporation. His experience in these organizations has contributed to his expertise in memory device testing and integrated circuit analysis.
Collaborations
Mochiduki has collaborated with notable professionals in his field, including Yuji Wada and Kaoru Fukuda. These collaborations have likely enriched his work and contributed to the development of his innovative patents.
Conclusion
Masaaki Mochiduki is a distinguished inventor whose work in memory device testing has led to significant advancements in the field. His innovative patents reflect his commitment to improving testing methodologies and enhancing the reliability of memory devices.