Martin Thomas Amodeo

Title: Martin Thomas Amodeo: Innovator in Integrated Circuit Testing

Introduction

Martin Thomas Amodeo is a notable inventor based in Santa Clara, California. He has made significant contributions to the field of integrated circuit (IC) testing, holding a total of four patents. His work focuses on diagnosing faults and defects in IC designs, which is crucial for ensuring the reliability and performance of electronic devices.

Latest Patents

Amodeo's latest patents include innovative methods for diagnosing multicycle transition faults and defects using at-speed ATPG test patterns. One of his patents describes an integrated circuit test engine that generates N-cycle at-speed test patterns to identify candidate faults in IC designs. This engine works in conjunction with a diagnostics engine that analyzes test result data to identify discrepancies between expected and actual results. Another patent focuses on utilizing transition ATPG test patterns to detect multicycle faults in IC chips. This involves generating two-cycle delay test patterns that target specific multicycle faults, enhancing the accuracy of fault detection in IC designs.

Career Highlights

Amodeo is currently employed at Cadence Design Systems, Inc., a leading company in electronic design automation. His expertise in IC testing has positioned him as a key player in the development of advanced testing methodologies. His contributions have not only advanced the field but have also improved the reliability of electronic products in the market.

Collaborations

Throughout his career, Amodeo has collaborated with talented professionals, including Arvind Chokhani and Joseph Michael Swenton. These collaborations have fostered innovation and have led to the development of cutting-edge testing solutions in the industry.

Conclusion

Martin Thomas Amodeo's work in integrated circuit testing exemplifies the importance of innovation in technology. His patents and contributions continue to shape the future of electronic design and testing methodologies.