Utilizing transition atpg test patterns to detect multicycle faults and/or defects in an ic chip

Abstract

An IC test engine generates a plurality of two-cycle delay test patterns that target a first set of multicycle faults and/or defects of a fabricated IC chip based on an IC design. Each two-cycle delay test pattern includes a scan-in shift window operating at a test clock frequency, and a capture window with a launch cycle and a capture cycle operating at a functional clock frequency. The IC test engine fault simulates the plurality of two-cycle delay test patterns against a second set of multicycle faults and/or defects in the IC design utilizing sim-shifting, such that a state of the IC design after at least a last two shift clock cycles of a scan-in shift in window of each two-cycle delay test pattern of the plurality of two-cycle delay test patterns are fault simulated to provide two fault initialization cycles for detection of a multicycle delay fault and/or defect.