For the Inventor, By the Inventor

Enter inventor name

Boise, ID, United States of America

Mark Bunn

USPTO Granted Patents = 4

Average Co-Inventor Count = 2.7

ph-index = 3

Forward Citations = 172(Granted Patents)

Location History:

Boise, ID (US) (1994 - 1995)
Caldwell, ID (US) (2007)

Company Filing History:

4 out of 38,002

Micron Technology Incorporated

Years Active: 1994-2007

Loading Chart...

4 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7274201 - Method and system for stressing semiconductor wafers during burn-in (2007-09-25),

2. 5461328 - Fixture for burn-in testing of semiconductor wafers (1995-10-24),

3. 5391892 - Semiconductor wafers having test circuitry for individual dies (1995-02-21),

4. 5279975 - Method of testing individual dies on semiconductor wafers prior to (1994-01-18),

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

Loading…