Ewing, NJ, United States of America

Mark A Friesel

This inventor holds 29 USPTO granted patents and 3 published patent applications, primarily in Radar Technology. Top assignees: Lockheed Martin Corporation, Lockheed Martin Corpora Tion. Active years: 2006-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark A Friesel. Retrieved from https://idiyas.com/inventor/mark-a-friesel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29 

% Patents Active = 24.1

Average Co-Inventor Count = 1.2

ph-index = 7

Forward Citations = 153(Granted Patents)


Company Filing History:


Years Active: 2006-2022

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Areas of Expertise:
Radar System
State Estimator
Clutter Suppression
UAV Retrieval
Covariance Assessment
Solar Heat Collector
Acoustic Decoy
Ballistic Missile
3D Point Images
Data Fusion
Signature Detection
Target Detection
29 patents (USPTO):Explore Patents

Title: The Inventor Mark A Friesel: Pioneering Innovations in Ewing, NJ

Introduction: Mark A Friesel is a distinguished inventor based in Ewing, NJ, known for his groundbreaking contributions to various technological fields.

Latest Patents: Mark A Friesel holds several patents in the areas of renewable energy technologies, advanced materials, and medical devices, showcasing his versatility and ingenuity.

Career Highlights: With a career spanning over two decades, Mark A Friesel has worked with leading research institutions and companies to develop cutting-edge solutions that have had a significant impact on society.

Collaborations: Throughout his career, Mark A Friesel has collaborated with top engineers, scientists, and designers, fostering a culture of innovation and excellence in all his projects.

Conclusion: Mark A Friesel's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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