The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Feb. 27, 2013
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Mark A. Friesel, Ewing, NJ (US);

Paul Mountcastle, Moorestown, NJ (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/58 (2006.01); G01S 13/66 (2006.01); G01S 13/89 (2006.01); G01S 13/72 (2006.01); G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
G01S 13/581 (2013.01); G01S 13/66 (2013.01); G01S 13/726 (2013.01); G01S 13/89 (2013.01);
Abstract

A method for identification of one or more launched objects obscured by debris objects within a debris field comprises: directing one or more sensor pulses at the debris field to obtain a plurality of sensor images; identifying objects within the debris field based on the sensor images; determining acceleration characteristics for each of the identified objects within the debris field based on the sensor images; identifying objects exhibiting free fall acceleration characteristics as debris objects; and identifying objects exhibiting centripetal acceleration characteristics as the one or more launched objects.


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