Saitama, Japan

Mamoru Hiraide

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Adv Antest Corporation. Active years: 2012-2014.

USPTO Granted Patents = 4 

% Patents Active = 25.0

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2012-2014

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4 patents (USPTO):Explore Patents

Title: Mamoru Hiraide: Innovator in Testing Technology

Introduction

Mamoru Hiraide is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of testing technology, holding a total of 4 patents. His work focuses on developing advanced test apparatuses and methods that enhance the efficiency and effectiveness of device testing.

Latest Patents

Hiraide's latest patents include innovative test apparatuses designed to improve the testing process for devices under test. One of his patents describes a test apparatus that includes a test module for sending and receiving signals to and from the device under test. This apparatus features a test controller that manages the test module and a network that facilitates communication between them. Notably, it can transmit a usage state packet indicating the status of a communication buffer. Another patent outlines a test apparatus with multiple test modules connected via a bus, allowing for efficient signal exchange and control among the modules.

Career Highlights

Mamoru Hiraide is currently employed at Adv Antest Corporation, where he continues to innovate in the field of testing technology. His work has been instrumental in advancing the capabilities of testing devices, making him a valuable asset to his company and the industry.

Collaborations

Hiraide collaborates with Takeshi Yaguchi, a fellow innovator in the field. Their partnership has contributed to the development of cutting-edge testing solutions.

Conclusion

Mamoru Hiraide's contributions to testing technology through his patents and collaborations highlight his role as a leading inventor in this field. His work continues to influence the way devices are tested, ensuring higher standards of quality and performance.

Profile summary based on public USPTO records.
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