The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Jan. 26, 2010
Applicants:
Mamoru Hiraide, Saitama, JP;
Takeshi Yaguchi, Saitama, JP;
Inventors:
Mamoru Hiraide, Saitama, JP;
Takeshi Yaguchi, Saitama, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a test apparatus and a test method related to the test apparatus for testing a device under test, including: a plurality of test modules that exchange a signal with the device under test; a test control section that outputs a group read instruction for collectively reading data stored in two or more of the test modules; and a control interface section that reads the data from the two or more test modules according to the group read instruction, and collectively sends the read data to the test control section.