The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Dec. 24, 2009
Mamoru Hiraide, Saitama, JP;
Mamoru Hiraide, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, comprising a test module section that tests the device under test; a test control section that generates control packets for controlling the test module section; and a connecting section that receives the control packets from the test control section and transmits the control packets to the test module section. The test module section includes a first test module that operates according to control packets having a first packet structure and a second test module that operates according to control packets having a second packet structure, which is obtained by adding an expansion region to a control packet having the first packet structure, the test control section transmits control packets having the second packet structure to the connecting section, and the connecting section (i) removes the expansion region from control packets having the second packet structure received from the test control section and transmits the resulting control packets to the first test module, and (ii) transmits control packets having the second packet structure received from the test control section to the second test module.