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For the Inventor, By the Inventor

Tokyo, Japan

Makoto Yonaha

This inventor holds 35 USPTO granted patents and 18 published patent applications and 8 EPO patents, primarily in Image Processing. Top assignees: Fujifilm Corporation, Fujifilm Toyama Chemical Co., Ltd.. Active years: 2008-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Yonaha. Retrieved from https://idiyas.com/inventor/makoto-yonaha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 35 

% Patents Active = 80.0

 

Average Co-Inventor Count = 1.4

ph-index = 3

Forward Citations = 63(Granted Patents)


Location History:

  • Kanagawa, JP (2008 - 2013)
  • Kanagawa-ken, JP (2010 - 2014)
  • Ashigarakami-gun, JP (2013 - 2023)
  • Tokyo, JP (2012 - 2024)

Company Filing History:

goldMedal32 out of 16,949 
 
Fujifilm Corporation
 patents
silverMedal3 out of 37 
 
Fujifilm Toyama Chemical Co., Ltd.
 patents

Years Active: 2008-2026

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Areas of Expertise:
Image Processing
Imaging System
Drug Inspection
Image Correction
Object Detection
Damage Diagram Creation
Image Composition
Monitoring System
Product Design Assistance
Authenticity Determination
Electronic Album Creation
Search System
35 patents (USPTO):Explore Patents
1. 12718164 - Image processing apparatus, image processing method, and image processing program (2026-08-25),
2. 12546885 - Imaging system, imaging method, imaging program, and information acquisition method (2026-02-10),
3. 12283035 - Information display apparatus, information display method, and information display program (2025-04-21),
4. 12283033 - Damage diagram creation support method and damage diagram creation support device (2025-04-21),
5. 12235191 - Flight imaging system and method (2025-02-25),
6. 11948291 - Damage diagram creation method, damage diagram creation device, damage diagram creation system, and recording medium (2024-04-02),
7. 11651864 - Drug inspection apparatus and method (2023-05-16),
8. 11523013 - Damage diagram creation method, damage diagram creation device, damage diagram creation system, and recording medium (2022-12-06),
9. 11423511 - Image composition method, image composition device, and recording medium (2022-08-23),
10. 11263739 - Repair length determination method and repair length determination apparatus (2022-03-01),
11. 11170477 - Image composition apparatus, image composition method, and program (2021-11-09),
12. 11080436 - Product design assistance device and product design assistance method (2021-08-03),
13. 11055823 - Image correction device, image correction method, and program (2021-07-06),
14. 10951821 - Imaging control device, imaging system, and imaging control method (2021-03-16),
15. 10896764 - Drug inspection apparatus and method (2021-01-19),

Title: Makoto Yonaha: Pioneering Inventor from Tokyo

Introduction: Makoto Yonaha is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Makoto Yonaha holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With over two decades of experience in the industry, Makoto Yonaha has worked with leading tech companies in Japan, spearheading projects that have revolutionized the way we interact with technology on a daily basis.

Collaborations: Throughout his career, Makoto Yonaha has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Makoto Yonaha's passion for innovation and his relentless drive to create a better future through technology make him a true pioneer in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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