The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Oct. 27, 2022
Fujifilm Corporation, Tokyo, JP;
Tadashi Kasamatsu, Ashigarakami-gun, JP;
Makoto Yonaha, Tokyo, JP;
Naoko Yoshida, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is a damage diagram creation support method, which includes: acquiring information on a region having internal damage to a structure within an inspection target region; acquiring a visible light image obtained by imaging the inspection target region with a visible light camera; detecting fissuring appearing on a surface of the structure in the visible light image; and creating a damage diagram in which the fissuring detected in the visible light image is traced. Also provided is a damage diagram creation support device capable of appropriately recording a detection result of fissuring automatically detected from an image.