This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Fei Comapny. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Lukas Hubner - Innovator in Transmission Electron Microscopy Sample Preparation
Introduction
Lukas Hubner is an inventor based in Jirikovice, Czech Republic. He has developed a method for preparing samples for transmission electron microscopy (TEM) analysis. This innovative approach aims to enhance the accuracy and efficiency of sample preparation in scientific research.
Latest Patent Applications
Lukas Hubner's notable patent application is titled "METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS." This method involves cleaning the sample to eliminate a redeposition layer, imaging the cleaned sample to identify a region of interest, and removing material based on this identified location. The process includes a thinning step that targets uneven surfaces and ensures that the silicon substrate volume has a defined thickness.
Conclusion
Lukas Hubner's contributions to the field of transmission electron microscopy represent significant advancements in sample preparation techniques. His innovative methods have the potential to improve research outcomes in various scientific disciplines.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile