Lucas Paul Winiarski

Title: Lucas Paul Winiarski: Patents in Microscopy and Materials Analysis.

Introduction

Lucas Paul Winiarski is an inventor based in Portland, Oregon. His patent work addresses microscopy image analysis and techniques for locating material boundaries. He is associated with FEI Company and holds 2 patents.

Latest Patents

“Device Line Understanding Using Composed Templates” describes computer-implemented methods for generating template information from microscope images. The process receives image data, detects a feature, and uses feature-template data to identify a grouping that includes the feature. It then generates and outputs information describing that grouping.

“Interface Detection in Reciprocal Space” describes methods for locating a boundary between materials in a sample by classifying reciprocal-space images taken at different positions. A neural network identifies the material at each position, and the results can be used to find a boundary with sub-micron accuracy. The disclosed approach can use binary search to speed up detection and can guide subsequent imaging, probing, or milling operations.

Career Highlights

Winiarski’s listed patents reflect work at the intersection of microscopy, image processing, and automated materials analysis. The techniques described support identifying structures in microscope images and locating interfaces between different materials.

Collaborations

His listed coworkers include John Francis Flanagan IV and Christopher John Hakala. The patent descriptions also identify work associated with FEI Company.

Conclusion

Lucas Paul Winiarski’s patents focus on improving microscope-image interpretation and enabling precise, automated detection of material boundaries.