The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Jun. 26, 2023
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
John Flanagan, Hillsboro, OR (US);
Hayley Johanesen, Portland, OR (US);
Lucas Paul Winiarski, Portland, OR (US);
Christopher Hakala, Hillsboro, OR (US);
Assignee:
FEI Company, Hillsboro, OR (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/66 (2017.01); G06T 7/73 (2017.01); G06V 10/75 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/66 (2017.01); G06T 7/74 (2017.01); G06V 10/751 (2022.01); G06V 20/698 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01);
Abstract
Systems, components, methods, and algorithms for generating template information are described. a computer-implemented method includes receiving microscope image data, detecting a feature in the microscope image data, receiving feature template data describing a grouping of features including the feature, detecting the grouping in the microscope image data based at least in part on the feature template data, generating template information describing the grouping, and outputting the template information.