Liop-Jin Yap

Title: Innovations by Liop-Jin Yap

Introduction

Liop-Jin Yap is a notable inventor based in Singapore, recognized for his contributions to the field of semiconductor testing. With a total of 5 patents to his name, he has developed innovative methods and apparatuses that enhance the efficiency and reliability of semiconductor device testing.

Latest Patents

One of his latest patents focuses on the testing of BGA and other CSP packages using probing techniques. This invention provides a method and apparatus for handling small semiconductor devices during testing. Multiple devices are mounted within a device strip carrier and positioned in the testing position. The positioning of the device strip carriers is performed using alignment tools, allowing for easy repositioning with respect to the test head or probe card for testing multiple devices contained within the carrier.

Another significant patent by Yap is a method and apparatus for establishing a quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate. This innovation introduces a new method to quickly and reliably position, connect, and dock a handler plate with a test head plate of a Universal Docking System. The handler plate is equipped with roller assemblies, while the test head plate features matching receiver block assemblies. The alignment and mechanical engagement of these components facilitate the locking of the test head plate with the handler plate, simultaneously establishing electrical contacts between arrays of pins mounted on the surfaces of both plates.

Career Highlights

Liop-Jin Yap is currently employed at St Assembly Test Services Inc., where he continues to push the boundaries of semiconductor testing technology. His work has significantly impacted the efficiency of testing processes in the semiconductor industry.

Collaborations

Throughout his career, Yap has collaborated with notable colleagues, including Chee-Keong Tan and Rajiv Mehta. These collaborations have further enriched his innovative contributions to the field.

Conclusion

Liop-Jin Yap's inventive spirit and dedication to advancing semiconductor testing technology have made him a prominent figure in the industry. His patents reflect a commitment to improving the reliability and efficiency of testing methods, showcasing his significant impact on the field.