The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2001
Filed:
Oct. 04, 1999
Applicant:
Inventor:
Liop-Jin Yap, Singapore, SG;
Assignee:
ST Assembly Test Services, Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/04 ; G01R 3/102 ; G01R 3/126 ; H01R 4/50 ; H05K 3/34 ;
U.S. Cl.
CPC ...
G01R 1/04 ; G01R 3/102 ; G01R 3/126 ; H01R 4/50 ; H05K 3/34 ;
Abstract
A new probe socket is provided that allows for high speed and dependable contacting of points of contact on the Device Under Test. The new probe socket is aimed at a testing environment where semiconductor devices are mounted on device or package strips.
Quick Actions:
Yap, Liop-Jin. (2001). Device probe socket forming part of a test head, interfacing between test head and a probe handler, used for device strip testing (U.S. Patent No. 6242933). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6242933
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile