Linxia Tan

Title: Linxia Tan: Innovator in Detection Technologies

Introduction

Linxia Tan is a prominent inventor based in Beijing, China. He has made significant contributions to the field of detection technologies, particularly in the area of ray scanning. With a total of 4 patents to his name, Tan's work has advanced the capabilities of inspection systems used in various applications.

Latest Patents

Linxia Tan's latest patents include an area array detector, detection method, and a corresponding container/vehicle inspection system. This innovation provides an area array detector that features sparsely arranged detector assemblies. The first detector assembly is distinct from the other second detector assemblies. Additionally, the system includes a backplane for carrying and mounting the detector assemblies, enabling various scanning modes. Another notable patent is a gathering and sampling device and inspection apparatus. This device features a cylindrical outer housing and an inner housing, creating a cyclone chamber that generates a cyclone by injecting a gas flow.

Career Highlights

Throughout his career, Linxia Tan has worked with notable organizations such as Nuctech Company Limited and Tsinghua University. His experience in these institutions has allowed him to develop and refine his innovative ideas in detection technologies.

Collaborations

Linxia Tan has collaborated with several professionals in his field, including Qingjun Zhang and Yuanjing Li. These collaborations have contributed to the advancement of his research and the successful development of his patents.

Conclusion

Linxia Tan is a distinguished inventor whose work in detection technologies has made a significant impact. His innovative patents and collaborations reflect his commitment to advancing the field.