The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Nov. 27, 2022
Applicant:
Nuctech Company Limited, Beijing, CN;
Inventors:
Linxia Tan, Beijing, CN;
Hao Yu, Beijing, CN;
Xiang Zou, Beijing, CN;
Weibin Zhu, Beijing, CN;
Junxiao Wang, Beijing, CN;
Assignee:
NUCTECH COMPANY LIMITED, Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/29 (2006.01); G01V 5/226 (2024.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); G01T 1/2018 (2013.01); G01V 5/226 (2024.01);
Abstract
This disclosure provides an area array detector, a detection method, and a corresponding container/vehicle inspection system, and relates to the field of ray scanning. The area array detector for the container/vehicle inspection system includes sparsely arranged detector assemblies, and a first detector assembly is different from other second detector assemblies; and a backplane for carrying and mounting detector assemblies, and the area array detector supporting scanning modes is enabled.