The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Sep. 21, 2016
Applicant:

Nuctech Company Limited, Haidian District, Beijing, CN;

Inventors:

Qingjun Zhang, Beijing, CN;

Yuanjing Li, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Weiping Zhu, Beijing, CN;

Ziran Zhao, Beijing, CN;

Qiufeng Ma, Beijing, CN;

Huishao He, Beijing, CN;

Jianping Chang, Beijing, CN;

Xiang Zou, Beijing, CN;

Linxia Tan, Beijing, CN;

Assignee:

Nuctech Company Limited, Haidian District, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/02 (2006.01); G01N 27/62 (2006.01); G01N 1/22 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 1/02 (2013.01); G01N 1/22 (2013.01); G01N 30/7206 (2013.01); G01N 30/72 (2013.01); G01N 2001/022 (2013.01); G01N 2001/024 (2013.01);
Abstract

The present invention discloses darkroom type security inspection apparatus and method. An apparatus comprises a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing are communicated by fittings or connectors and comprises: a sampling assembly comprising a sample collecting unit and a conveyer unit configured to convey an object to be inspected into the sample collecting unit; a sample processing assembly configured to concentrate and analyze the sample; and, an inspecting assembly configured to inspect composition of the sample by means of a gas chromatographic-ion mobility spectrometer (GC-IMS) or a separated ion mobility spectrometer (IMS). The security inspection apparatus of the present invention can perform the sampling easy, rapidly and effectively and perform the inspection accurately and rapidly without destroying and unpacking an object to be inspected, and thus is suitable for requirements of on-site rapid inspection of forbidden items in the airport, customs and the likes.


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