Nuctech Company Limited

Tsinghua University

Linxia Tan

Yuanjing Li

Ziran Zhao

Qingjun Zhang

Qiufeng Ma

Xiang Zou

Zhiqiang Chen

Jianping Chang

Junxiao Wang

Yinong Liu

Yaohong Liu

Ge Li

Hao Yu

Biao Cao

Weiping Zhu

Huishao He

Yanchun Wang

Weibin Zhu

This disclosure provides an area array detector, a detection method, and a corresponding container/vehicle inspection system, and relates to the field of ray scanning. The area array detector for the container/vehicle inspection system includes sparsely arranged detector assemblies, and a first detector assembly is different from other second detector assemblies; and a backplane for carrying and mounting detector assemblies, and the area array detector supporting scanning modes is enabled.

Area array detector, detection method, and corresponding container/vehicle inspection system

A sampling device and an inspection apparatus are disclosed. In one aspect, an example gathering and sampling device includes a cylindrical outer housing and an inner housing disposed within the cylindrical outer housing, a cyclone chamber is formed between the cylindrical outer housing and the inner housing to generate a cyclone by injecting a gas flow into the cyclone chamber. The gathering and sampling device further includes an outer chamber body, and a plurality of gas injection orifices formed in the first inner housing end opening of the inner housing and configured to inject a gas towards a substantial center of a circular region defined by an end face of the first outer housing end opening of the cylindrical outer housing.

Gathering and sampling device and inspection apparatus

The present invention discloses darkroom type security inspection apparatus and method. An apparatus comprises a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing are communicated by fittings or connectors and comprises: a sampling assembly comprising a sample collecting unit and a conveyer unit configured to convey an object to be inspected into the sample collecting unit; a sample processing assembly configured to concentrate and analyze the sample; and, an inspecting assembly configured to inspect composition of the sample by means of a gas chromatographic-ion mobility spectrometer (GC-IMS) or a separated ion mobility spectrometer (IMS). The security inspection apparatus of the present invention can perform the sampling easy, rapidly and effectively and perform the inspection accurately and rapidly without destroying and unpacking an object to be inspected, and thus is suitable for requirements of on-site rapid inspection of forbidden items in the airport, customs and the likes.

Darkroom type security inspection apparatus and method

The present invention discloses a general sample injector, comprising a sample injection port mechanism, a sample injector shell, a vaporizing chamber, a heater, a temperature control unit, a carrier gas channel, a septum purge channel, a flow splitting channel, a coolant channel, a multichannel flow control valve and a temperature control unit. The general sample injector, equivalent to a 'programmed temperature vaporizer' injector combining splitting/no splitting with cold column head sample injection, gives full play to the advantages of various sample injection modes, overcomes a plurality of disadvantages, and has higher practicability and better flexibility.

General sample injector, gas chromatograph and combined spectrometer

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Beijing, China

Linxia Tan