San Diego, CA, United States of America

Li Fan

This inventor holds 14 USPTO granted patents, primarily in MEMS Technology. Top assignees: Omm, Inc., Formfactor, Inc., Other. Active years: 2002-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Li Fan. Retrieved from https://idiyas.com/inventor/li-fan-eo7eezvg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 85.7

Average Co-Inventor Count = 2.2

ph-index = 10

Forward Citations = 317(Granted Patents)


Location History:

  • San Diego, CA (US) (2002 - 2003)
  • Rowland Heights, CA (US) (2003)
  • Livermore, CA (US) (2015)
  • San Ramon, CA (US) (2010 - 2017)

Company Filing History:


Years Active: 2002-2017

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Areas of Expertise:
Probe Card Assembly
MEMS Device
Optical Switch
Micromachined Switches
Cantilevered Beam
Collimator Arrays
Contact Structures
Actuators
Torsional Hinge
Power Monitoring
Staggered Mounting
Fabrication Method
14 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Li Fan

Introduction

Li Fan is a prominent inventor based in San Diego, CA, known for his significant contributions to the field of electronic device testing. With a total of 14 patents to his name, he has made remarkable advancements that enhance the efficiency and effectiveness of electronic testing processes.

Latest Patents

Among his latest patents is a "Probe card assembly for testing electronic devices." This invention features a guide plate with probe guides that hold probes in predetermined positions. The assembly also includes a wiring structure attached to the guide plate, allowing connection tips of the probes to be positioned against contacts on the wiring structure. This design enables the wiring structure to expand or contract at a greater rate than the guide plate. Additionally, the probes incorporate compliant elements that fail upon exposure to high electrical current and thermal stresses, strategically located away from the contact tips. Another notable patent is the "Probe with cantilevered beam having solid and hollow sections." This electrically conductive probe consists of a post with an attached beam structure. The beam features a cantilevered portion extending to a free end where a contact structure is affixed. This innovative design allows multiple probes to be utilized in a test contactor for making electrical connections with electronic devices, such as semiconductor dies.

Career Highlights

Li Fan has worked with several notable companies throughout his career, including Omm, Inc. and FormFactor, Inc. His work in these organizations has contributed to the development of advanced testing technologies that are crucial for the semiconductor industry.

Collaborations

Li has collaborated with talented individuals in his field, including Anis Husain and John K. Gritters. These partnerships have fostered innovation and have led to the successful development of various technologies.

Conclusion

Li Fan's contributions to the field of electronic device testing through his innovative patents and collaborations highlight his role as a leading inventor. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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