Company Filing History:

7 out of 12

Omm, Inc.

patents

5 out of 506

Formfactor, Inc.

patents

2 out of 832,843

Other

patents

Years Active: 2002-2017

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14 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9588139 - Probe card assembly for testing electronic devices (2017-03-07),

2. 9052342 - Probe with cantilevered beam having solid and hollow sections (2015-06-09),

3. 8203352 - Single support structure probe group with staggered mounting pattern (2012-06-19),

4. 8148646 - Process of positioning groups of contact structures (2012-04-03),

5. 7872394 - MEMS device with two axes comb drive actuators (2011-01-18),

6. 7782072 - Single support structure probe group with staggered mounting pattern (2010-08-24),

7. 6600850 - MEMS optical switch with a notched latching apparatus for improved mirror positioning and method of fabrication thereof (2003-07-29),

8. 6556741 - MEMS optical switch with torsional hinge and method of fabrication thereof (2003-04-29),

9. 6526198 - Micromachined optomechanical switches (2003-02-25),

10. 6498870 - Micromachined optomechanical switches (2002-12-24),

11. 6453083 - Micromachined optomechanical switching cell with parallel plate actuator and on-chip power monitoring (2002-09-17),

12. 6449406 - Micromachined optomechanical switching devices (2002-09-10),

13. 6445841 - Optomechanical matrix switches including collimator arrays (2002-09-03),

14. 6445840 - Micromachined optical switching devices (2002-09-03),

Title: The Innovative Contributions of Li Fan

Introduction

Li Fan is a prominent inventor based in San Diego, CA, known for his significant contributions to the field of electronic device testing. With a total of 14 patents to his name, he has made remarkable advancements that enhance the efficiency and effectiveness of electronic testing processes.

Latest Patents

Among his latest patents is a "Probe card assembly for testing electronic devices." This invention features a guide plate with probe guides that hold probes in predetermined positions. The assembly also includes a wiring structure attached to the guide plate, allowing connection tips of the probes to be positioned against contacts on the wiring structure. This design enables the wiring structure to expand or contract at a greater rate than the guide plate. Additionally, the probes incorporate compliant elements that fail upon exposure to high electrical current and thermal stresses, strategically located away from the contact tips. Another notable patent is the "Probe with cantilevered beam having solid and hollow sections." This electrically conductive probe consists of a post with an attached beam structure. The beam features a cantilevered portion extending to a free end where a contact structure is affixed. This innovative design allows multiple probes to be utilized in a test contactor for making electrical connections with electronic devices, such as semiconductor dies.

Career Highlights

Li Fan has worked with several notable companies throughout his career, including Omm, Inc. and FormFactor, Inc. His work in these organizations has contributed to the development of advanced testing technologies that are crucial for the semiconductor industry.

Collaborations

Li has collaborated with talented individuals in his field, including Anis Husain and John K. Gritters. These partnerships have fostered innovation and have led to the successful development of various technologies.

Conclusion

Li Fan's contributions to the field of electronic device testing through his innovative patents and collaborations highlight his role as a leading inventor. His work continues to influence the industry and pave the way for future advancements.

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