Leland R Nevill

This inventor holds 58 USPTO granted patents, primarily in Integrated Circuit Testing (CPC class 3652). Top assignees: Micron Technology Incorporated, Other. Active years: 1989-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Leland R Nevill. Retrieved from https://idiyas.com/inventor/leland-r-nevill

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 58

% Patents Active = 79.3

Average Co-Inventor Count = 3.0

ph-index = 21

Forward Citations = 1,213(Granted Patents)

Forward Citations (Not Self Cited) = 1,163(Dec 10, 2025)

Inventors with similar research interests:

Company Filing History:

56 out of 39,253

Micron Technology Incorporated

patents

2 out of 834,570

Other

patents

Years Active: 1989-2016

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Areas of Expertise:

Error Detection

Memory Management

Integrated Circuit

Data Compression

Testing Method

Semiconductor Wafer

Isolation Technique

Self-Test Circuit

Alignment Feature

Reduced Terminal Testing

Surge Capacitors

Burn-In Testing

58 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9483370 - Error detection/correction based memory management (2016-11-01),

2. 7567091 - Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2009-07-28),

3. RE40623 - Method and apparatus for identifying integrated circuits (2009-01-19),

4. 7323896 - Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2008-01-29),

5. 7315179 - System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2008-01-01),

6. 7276927 - Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2007-10-02),

7. 7276926 - Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2007-10-02),

8. 7212020 - Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2007-05-01),

9. 7034561 - Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2006-04-25),

10. RE38956 - Data compression circuit and method for testing memory devices (2006-01-30),

11. 6858453 - Integrated circuit package alignment feature (2005-02-22),

12. 6852999 - Reduced terminal testing system (2005-02-08),

13. 6836003 - Integrated circuit package alignment feature (2004-12-28),

14. 6831475 - Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer (2004-12-14),

15. 6815968 - Reduced terminal testing system (2004-11-09),

Title: The Innovative Journey of Leland R Nevill

Introduction: Leland R Nevill, a pioneering inventor based in Boise, ID, has made significant contributions to the field of technology with his inventive spirit and dedication to innovation.

Latest Patents: Leland R Nevill holds several patents in various technological domains, showcasing his versatility and creativity in inventing new solutions to complex problems.

Career Highlights: Throughout his illustrious career, Leland R Nevill has been at the forefront of technological advancements, leading groundbreaking projects and pushing the boundaries of innovation.

Collaborations: Leland R Nevill has collaborated with top research institutions, leading companies, and brilliant minds in the industry, fostering a culture of innovation and knowledge sharing.

Conclusion: In conclusion, Leland R Nevill's passion for innovation and his relentless pursuit of excellence have established him as a prominent figure in the world of inventors, leaving a lasting impact on the technological landscape.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]