This inventor holds 8 USPTO granted patents and 3 published patent applications. Top assignee: New York University. Active years: 2017-2026.
Company Filing History:
Years Active: 2017-2026
Title: Leeor Alon: Innovator in Dielectric Imaging Technology
Introduction
Leeor Alon is a prominent inventor based in New York, NY (US), known for his contributions to the field of dielectric imaging technology. With a total of 8 patents to his name, Alon has made significant strides in developing systems that enhance the detection of dielectric changes in matter.
Latest Patents
Among his latest innovations, Alon has developed a system to detect dielectric changes in matter. This system includes a data collection array designed to gather microwave scattering data. It also features a machine learning device that analyzes this data to generate images, which can identify the presence or absence of disease and highlight specific disease features. Another notable patent focuses on systems and methods for detecting dielectric changes, utilizing patient information and imaging modality data to predict disease states and features.
Career Highlights
Alon is affiliated with New York University, where he continues to advance his research and development efforts. His work is at the intersection of technology and healthcare, aiming to improve diagnostic capabilities through innovative imaging techniques.
Collaborations
Alon collaborates with esteemed colleagues such as Daniel K. Sodickson and Seena Dehkharghani, contributing to a dynamic research environment that fosters innovation and discovery.
Conclusion
Leeor Alon's work in dielectric imaging technology exemplifies the impact of innovation in healthcare diagnostics. His patents and collaborations reflect a commitment to advancing medical technology for better patient outcomes.