The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Jul. 08, 2021
New York University, New York, NY (US);
Leeor Alon, New York, NY (US);
Seena Dehkharghani, Larchmont, NY (US);
New York University, New York, NY (US);
Abstract
Systems and methods for detecting dielectric changes in matter are provided. The system includes a data collection array to collect microwave scattering data and a machine learning device. The machine learning device is configured to receive the microwave scattering data, patient information, and imaging modality data corresponding to at least one of a presence of disease, absence of disease, or one or more disease features; analyze the microwave scattering data, patient information, and imaging modality data; output at least one of a predicted disease state and predicted features based on the analyzed microwave scattering data, patient information, and imaging modality data; compare the imaging modality data corresponding to the at least one of a presence of disease, absence of disease, or one or more disease features to the predicted disease state or predicted features; and use the comparison as an input into the machine learning device.