The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Jun. 03, 2024
Applicant:
New York University, New York, NY (US);
Inventors:
Leeor Alon, New York, NY (US);
Seena Dehkharghani, Larchmont, NY (US);
Assignee:
NEW YORK UNIVERSITY, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 3/08 (2023.01); G16H 10/60 (2018.01); G16H 30/20 (2018.01); G16H 40/63 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 3/08 (2013.01); G16H 10/60 (2018.01); G16H 30/20 (2018.01); G16H 40/63 (2018.01);
Abstract
A system of reconstructing a dielectric image is provided. The system includes a data collection array to collect microwave scattering data. The system includes a machine learning device configured to receive the microwave scattering data, analyze the microwave scattering data, output a generated image based on the analyzed microwave scattering data, and identify at least one of a presence of disease, absence of disease, or one or more disease features from the generated image.