The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Apr. 07, 2014
Applicant:

New York University, New York, NY (US);

Inventors:

Daniel K. Sodickson, Larchmont, NY (US);

Dmitry S. Novikov, New York, NY (US);

Leeor Alon, New York, NY (US);

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01); G01N 27/60 (2006.01); G01R 33/48 (2006.01); G01R 33/24 (2006.01);
U.S. Cl.
CPC ...
G01N 27/60 (2013.01); G01R 33/48 (2013.01); G01R 33/246 (2013.01);
Abstract

Exemplary system, method, and computer-accessible medium can be provided for determining at least one property (e.g., an electrical property or a cross-section property) of at least one target. For example, it is possible to determine electromagnetic-field-related quantities associated with signals provided from the target(s). The electromagnetic-field-related quantities can be provided to procedures to relate the electromagnetic-field-related quantities to a plurality of unknown electrical property values and residual field-related unknown values of the target(s). The property(ies) of the target(s) can be determined by determining the plurality of unknown electrical property values and residual field-related unknown values of the target(s).


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