Larry J Lape

Title: The Innovations of Larry J Lape

Introduction

Larry J Lape is an accomplished inventor based in Sugar Land, TX (US). He has made significant contributions to the field of integrated circuit testing and has been awarded 3 patents for his innovative designs. His work primarily focuses on enhancing the efficiency and reliability of burn-in processes for integrated circuits.

Latest Patents

One of Larry's latest patents is for a reusable die carrier designed for burn-in and electrical testing. This reusable carrier includes a base and a lid attached by hinges, allowing for the temporary holding of an integrated circuit during testing. The design features a flexible substrate that is securely attached to the base. Alignment posts with tapered surfaces engage the corners of the integrated circuit, ensuring precise positioning on the substrate. A spring-loaded latch secures the lid over the integrated circuit, while electrically conductive traces on the substrate connect the integrated circuit to peripheral contact pads. This innovative design provides a reliable electrical connection and facilitates standard burn-in processes.

Career Highlights

Larry J Lape is currently employed at Aehr Test Systems, Inc., where he continues to develop cutting-edge solutions for integrated circuit testing. His expertise in the field has made him a valuable asset to the company and the industry as a whole.

Collaborations

Throughout his career, Larry has collaborated with notable colleagues, including Rhea J Posedel and James Wrenn. These partnerships have contributed to the advancement of technology in integrated circuit testing.

Conclusion

Larry J Lape's innovative contributions to the field of integrated circuit testing demonstrate his commitment to enhancing technology. His patents reflect a deep understanding of the challenges in the industry and provide effective solutions for reliable testing processes.