This inventor holds 6 USPTO granted patents. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2003-2008.
Location History:
- Suwon, KR (2006)
- Suwon-si, KR (2003 - 2008)
- Gyeonggi-do, KR (2008)
Company Filing History:
Years Active: 2003-2008
Title: Kye-Weon Kim: Innovator in Substrate Inspection Technologies
Introduction
Kye-Weon Kim is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of substrate inspection technologies, holding a total of 6 patents. His work focuses on developing methods and apparatuses that enhance the accuracy and efficiency of substrate measurements.
Latest Patents
Among his latest patents is a "Method and apparatus for inspecting substrate pattern." This innovation involves a method of inspecting an inspection pattern using a statistical inference function. The inference function is generated in relation to optical reference signal data and reference pattern characteristic data for a plurality of reference patterns formed by a unit process of interest on reference substrates. Another notable patent is the "Apparatus and method for measuring a thickness of a substrate." This invention describes a process where a first light is reflected from a standard sample with a known thickness. The light is then concentrated through a light-focusing lens and converted into an electrical signal by a detector. A second light is reflected from a substrate and similarly processed. The operating unit calculates the thickness of the substrate using the peak values from the electrical signals.
Career Highlights
Kye-Weon Kim is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and develop new technologies. His work has significantly impacted the field of substrate inspection, making processes more reliable and efficient.
Collaborations
He has collaborated with notable coworkers, including Chung-Sam Jun and Yu-Sin Yang, contributing to various projects and advancements in their field.
Conclusion
Kye-Weon Kim's contributions to substrate inspection technologies exemplify his innovative spirit and dedication to advancing the industry. His patents reflect a commitment to improving measurement techniques, which are crucial for various applications in electronics and manufacturing.