Kwangho Kim

Title: Kwangho Kim: Innovator in Memory Device Testing

Introduction

Kwangho Kim is a notable inventor based in Pleasanton, CA (US), recognized for his contributions to memory device testing technologies. With a total of 2 patents, he has made significant advancements in the field of nonvolatile memory and testing methodologies.

Latest Patents

Kwangho Kim's latest patents include a "Clock frequency doubler method and apparatus for serial flash testing" and a "Nonvolatile memory and method of operation thereof to control erase disturb." The first patent describes a method and apparatus for testing memory devices at a higher clock rate than what is provided by a memory tester. This innovative approach involves generating a second clock signal in response to a first clock signal, allowing for efficient testing of memory devices at elevated frequencies. The second patent focuses on an array of nonvolatile memory cells, utilizing peripheral circuitry to manage erase operations and minimize erase disturb, thereby enhancing the reliability of memory devices.

Career Highlights

Throughout his career, Kwangho Kim has worked with prominent companies in the semiconductor industry, including Winbond Electronics Corporation and Nexflash Technologies, Inc. His experience in these organizations has contributed to his expertise in memory technology and device testing.

Collaborations

Kwangho Kim has collaborated with notable professionals in the field, including Eungjoon Park and Tien-Ler Lin. These collaborations have further enriched his work and innovations in memory device technologies.

Conclusion

Kwangho Kim's contributions to memory device testing and nonvolatile memory technology highlight his role as an influential inventor in the industry. His innovative patents and career achievements reflect his commitment to advancing technology in this critical field.