Company Filing History:
Years Active: 2012-2013
Title: Kurt Hahn: Innovator in Optical Inspection Technologies
Introduction
Kurt Hahn is a notable inventor based in Giessen, Germany, recognized for his contributions to optical inspection technologies. With a total of two patents to his name, Hahn has made significant advancements in the field of wafer inspection.
Latest Patents
Hahn's latest patents include an apparatus for the optical inspection of wafers. This apparatus features an assembly unit that carries optical elements for both bright field and dark field illumination paths. The design ensures that all illumination and detection paths are telecentric, enhancing the precision of the inspection process. Another patent focuses on illumination means for the inspection of flat substrates. This innovative illumination means is designed as an annular segment, allowing for effective light distribution without direct perpendicular impingement on the substrate's edges.
Career Highlights
Throughout his career, Kurt Hahn has worked with prominent companies in the semiconductor industry, including Vistec Semiconductor Systems GmbH and KLA-Tencor Mie GmbH. His work in these organizations has contributed to the development of advanced optical inspection technologies.
Collaborations
Hahn has collaborated with notable professionals in his field, including Christof Krampe-Zadler and Michael Hofmann. These collaborations have further enriched his work and innovations in optical inspection.
Conclusion
Kurt Hahn's contributions to optical inspection technologies have established him as a significant figure in the field. His innovative patents and collaborations reflect his commitment to advancing technology in wafer inspection.