This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: Macronix International Co., Ltd., National Tsing Hua University. Active years: 2005-2015.
Location History:
- Taichung, TW (2005)
- Hsinchu, TW (2015)
Company Filing History:
1 out of 3,609 
1 out of 1,308 Years Active: 2005-2015
Title: Kuo-Hao Chang: Innovator in Defect Image Classification and Overlay Error Measurement
Introduction
Kuo-Hao Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the fields of image analysis and data mining, particularly in the context of defect classification and overlay error measurement. With a total of 2 patents, his work has had a substantial impact on manufacturing processes.
Latest Patents
One of Kuo-Hao Chang's latest patents is a method of defect image classification through integrating image analysis and data mining. This innovative method allows for the automatic classification of defect images without the need for human intervention. By processing defect images through automatic optical detection, the invention enhances the performance of finding and classifying defects, thereby reducing the product defect rate. The integration of image analysis and data mining ensures increased consistency, correctness, and reliability in defect classification.
Another significant patent is related to overlay error measurement in the manufacturing of VLSI circuits. This invention provides an overlay error model and a sampling strategy to measure overlay errors accurately. By utilizing this model and strategy, a device for measuring overlay errors is designed, which helps achieve higher resolution and alignment accuracy in the microlithographic process.
Career Highlights
Kuo-Hao Chang has worked with esteemed institutions such as National Tsing Hua University and Macronix International Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology and manufacturing.
Collaborations
Throughout his career, Kuo-Hao Chang has collaborated with notable colleagues, including Chen-Fu Chien and Shun-Li Lin. These collaborations have fostered a creative environment that has led to the development of groundbreaking inventions.
Conclusion
Kuo-Hao Chang's contributions to defect image classification and overlay error measurement demonstrate his innovative spirit and commitment to enhancing manufacturing processes. His patents reflect a deep understanding of technology and its applications in real-world scenarios.