The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Jan. 14, 2014
Applicant:
National Tsing Hua University, Hsinchu, TW;
Inventors:
Assignee:
NATIONAL TSING HUA UNIVERSITY, Hsinchu, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/66 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00543 (2013.01);
Abstract
A method for classifying defect images is provided. Defect images are processed through an automatic optical detection. The present invention integrates image analysis and data mining. Defects are found on the images without using human eye. The defects are classified for reducing product defect rate. Thus, the present invention effectively enhances performance on finding and classifying defects with increased consistency, correctness and reliability.