This inventor holds 4 USPTO granted patents and 9 published patent applications. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Kuan Chun Chen: Innovator in Circuit Probe Test Systems
Introduction
Kuan Chun Chen is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of circuit probe test systems, showcasing his expertise through innovative patent designs. His work focuses on enhancing the efficiency and effectiveness of testing electronic devices.
Latest Patents
Kuan Chun Chen holds a patent titled "Probe head structures for circuit probe test systems and methods of forming the same." This invention involves a probe card designed for circuit probe test systems, which includes a substrate portion, a guide plate with multiple openings, and several probe pins. Among these, at least one probe pin is configured to carry power to a device-under-test (DUT), while another is designed to electrically couple the DUT to ground. Additionally, the design incorporates third probe pins that facilitate loopback test signals between contact regions on the DUT. The use of low dielectric constant (low-k) material between the third probe pins and the guide plate enhances signal integrity by preventing direct contact with higher dielectric-constant materials.
Career Highlights
Kuan Chun Chen is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His role involves developing advanced testing solutions that contribute to the reliability and performance of semiconductor devices. His innovative approach has positioned him as a key figure in the field.
Collaborations
Kuan Chun Chen has collaborated with notable colleagues, including Shu An Shang and Kai-Yi Tang. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in circuit testing.
Conclusion
Kuan Chun Chen's contributions to circuit probe test systems exemplify his commitment to innovation in the semiconductor industry. His patent reflects a deep understanding of the technical challenges in electronic testing, and his work continues to influence advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile