The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Nov. 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Kuan Chun Chen, Hsinchu City, TW;
Shu An Shang, Kaohsiung City, TW;
Guang-Sing Huang, Hsinchu County, TW;
Kai-Yi Tang, New Taipei City, TW;
Hsiou-Yu He, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Abstract
Provided is a testing system and a testing method of using the same. The testing system includes a probe card for testing a device under test (DUT). The probe card includes: a space transformer; a circuit board over a first surface of the space transformer; and a probe head over a second surface of the space transformer. The probe head includes: a lower plate spaced from an upper plate by a spacer; at least two loopback probe pins respectively penetrating through the lower plate and the upper plate to carry a loopback test signal between at least two loopback bumps on the DUT; and a first shielding structure extending from a lower surface of the lower plate toward an upper surface of the DUT and horizontally disposed between the at least two loopback probe pins, wherein the first shielding structure is configured to have a ground voltage.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile