Rehovot, Israel

Konstantin Chirko

USPTO Granted Patents = 9 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2014-2025

Loading Chart...
9 patents (USPTO):

Title: Konstantin Chirko: Innovator in Scanning Electron Microscopy

Introduction

Konstantin Chirko is a prominent inventor based in Rehovot, Israel. He has made significant contributions to the field of scanning electron microscopy, holding a total of 9 patents. His work focuses on non-destructive tomography and three-dimensional reconstruction techniques, which have applications in various scientific and industrial fields.

Latest Patents

One of his latest patents involves a system for non-destructive tomography of specimens using scanning electron microscopy (SEM). This system includes a SEM and processors that work together to obtain a sinogram of a tested specimen. The SEM projects e-beams onto the specimen and measures the intensity of returned electrons. The processors then create a tomographic map by determining values indicative of components defined by a specific equation.

Another notable patent describes a method for geometry-based three-dimensional reconstruction of a semiconductor specimen. This method utilizes at least two SEM images acquired at different illumination angles. By solving an optimization problem, the system determines height values that inform the height profile of the specimen. This innovative approach enhances the accuracy of semiconductor analysis.

Career Highlights

Konstantin has worked with notable companies such as Applied Materials Israel Limited and Applied Materials Israel Ltd. His experience in these organizations has allowed him to develop and refine his expertise in electron microscopy and related technologies.

Collaborations

Throughout his career, Konstantin has collaborated with talented individuals, including Alon Litman and Guy Eytan. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Konstantin Chirko is a distinguished inventor whose work in scanning electron microscopy has led to significant advancements in non-destructive testing and three-dimensional reconstruction. His contributions continue to impact the field and inspire future innovations.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…