Tokyo, Japan

Koji Tanimoto

This inventor holds 17 USPTO granted patents, primarily in Flow Rate Measurement. Top assignees: Mitsubishi Electric Corporation, Mitsubishi Denki Kabushiki Kaisha. Active years: 1992-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koji Tanimoto. Retrieved from https://idiyas.com/inventor/koji-tanimoto-yy1slz15

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 58.8

Average Co-Inventor Count = 3.6

ph-index = 6

Forward Citations = 77(Granted Patents)


Location History:

  • Hyogo, JP (1992)
  • Chiyoda-ku, JP (2008 - 2014)
  • Tokyo, JP (2003 - 2023)

Company Filing History:


Years Active: 1992-2023

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Areas of Expertise:
Flow Rate Measurement
Thermal Sensors
Semiconductor Strain Detection
Air Flow Meter
Thermal Flow Sensor
Knock Sensor
Detection Signal
Measurement Apparatus
Thermosensitive Device
Stress Reducing Means
Physical Amount Measurement
Flow Direction Change
17 patents (USPTO):Explore Patents

Title: Koji Tanimoto: Innovator in Semiconductor Technology

Introduction

Koji Tanimoto is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 17 patents. His work focuses on improving the precision and efficiency of various measurement devices.

Latest Patents

One of Tanimoto's latest patents is a semiconductor strain detection element with an impurity diffusion layer. The objective of this invention is to reduce the influence of noise caused by electric conduction carriers trapped between the surface of a silicon substrate and an oxide. This innovation aims to achieve strain detection with a high signal-to-noise (S/N) ratio. The semiconductor strain detection element consists of a silicon substrate and a first impurity diffusion layer, which has a conduction type different from that of the silicon substrate. This layer is formed inside the silicon substrate, allowing for the detection of strain based on changes in the resistance of the first impurity diffusion layer.

Another notable patent is a physical amount measurement apparatus that is mounted integrally with a flow rate measurement apparatus. This invention provides an intake air temperature detection apparatus that improves temperature measurement precision by enhancing the thermal responsiveness of the intake air temperature detection part. This part is arranged in the measurement passage of the flow rate measurement apparatus and detects the temperature of the intake air, which is the fluid being measured. The apparatus includes a detection part for measuring the intake air temperature and a circuit part that generates a signal through phase lead correction based on the detection results.

Career Highlights

Throughout his career, Koji Tanimoto has worked with notable companies such as Mitsubishi Electric Corporation and Mitsubishi Denki Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in semiconductor technology and measurement devices.

Collaborations

Tanimoto has collaborated with several professionals in his field, including Yuji Ariyoshi and Masahiro Kawai. These collaborations have likely enhanced his innovative capabilities and contributed to the development of his patents.

Conclusion

Koji Tanimoto is a distinguished inventor whose work in semiconductor technology has led to significant advancements in measurement devices. His innovative patents reflect his commitment to improving precision and efficiency in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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