The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Oct. 04, 2010
Naoyuki Kishikawa, Chiyoda-ku, JP;
Koji Tanimoto, Chiyoda-ku, JP;
Yuji Ariyoshi, Chiyoda-ku, JP;
Masahiro Kawai, Chiyoda-ku, JP;
Shinichiro Hidaka, Chiyoda-ku, JP;
Hiroyuki Uramachi, Chiyoda-ku, JP;
Naoyuki Kishikawa, Chiyoda-ku, JP;
Koji Tanimoto, Chiyoda-ku, JP;
Yuji Ariyoshi, Chiyoda-ku, JP;
Masahiro Kawai, Chiyoda-ku, JP;
Shinichiro Hidaka, Chiyoda-ku, JP;
Hiroyuki Uramachi, Chiyoda-ku, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
Provided is a flow rate measuring apparatus which prevents a reduction in flow-rate detection accuracy through reducing stress applied to a flow rate detection element. The flow rate measuring apparatus includes a support member () provided with a stepped portion () formed between a region facing a circuit board () and a region facing a detection portion of a flow rate detection element (), in which the support member () includes a groove portion () provided on a side opposite to an insertion hole () with respect to the region facing the detection portion, for reducing stress applied to the flow rate detection element ().