Company Filing History:
Years Active: 2013-2014
Title: Innovations of Koichi Miyazono
Introduction
Koichi Miyazono is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of surface inspection technology, holding a total of 4 patents. His work focuses on developing advanced apparatuses that enhance the analysis and inspection of surfaces.
Latest Patents
Miyazono's latest patents include a feature analyzing apparatus for the surface of an object. This innovative device allows for visual confirmation of features of an inspected object while minimizing the limitations on the degree of freedom of classification based on those features. The apparatus acquires information about the inspected object, analyzes it to determine values of feature parameters across multiple layers, and generates a set of coordinate values in 3D space as feature information. Another significant patent is a substrate surface inspecting apparatus and method. This technology enables the judgment and analysis of the state of even portions of a substrate supported by various supports using captured images. The method involves a support mechanism that optimizes the arrangement of substrate support positions to enhance the imaging process.
Career Highlights
Koichi Miyazono is currently employed at Shibaura Mechatronics Corporation, where he continues to innovate in the field of mechatronics and surface inspection technologies. His work has been instrumental in advancing the capabilities of inspection apparatuses, making them more efficient and effective.
Collaborations
Miyazono has collaborated with several talented individuals in his field, including Yoshinori Hayashi and Hiroshi Wakaba. These collaborations have contributed to the development of cutting-edge technologies in surface inspection.
Conclusion
Koichi Miyazono's contributions to surface inspection technology through his patents and collaborations highlight his role as a leading inventor in this field. His innovative approaches continue to shape the future of inspection methodologies.