The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Dec. 01, 2008
Yoshinori Hayashi, Yokohama, JP;
Hiroshi Wakaba, Yokohama, JP;
Koichi Miyazono, Yokohama, JP;
Yoko Ono, Yokohama, JP;
Hideki Mori, Yokohama, JP;
Yoshinori Hayashi, Yokohama, JP;
Hiroshi Wakaba, Yokohama, JP;
Koichi Miyazono, Yokohama, JP;
Yoko Ono, Yokohama, JP;
Hideki Mori, Yokohama, JP;
Shibaura Mechatronics Corporation, Yokohama-shi, JP;
Abstract
A feature analysis apparatus which enables visual confirmation of features of an inspected object and which enables limitations on the degree of freedom of classification based on the features to made relatively smaller is provided. It acquires inspected object information of an inspected object (S), analyzes the inspection information to determine values of feature parameters of each of the plurality of layers (Sto S), uses values of the plurality of feature parameters and their corresponding directions for each of the plurality of layers to generate a single parameter vector (Sto S), converts the parameter vector to a layer vector which is a 3D vector in a predetermined (Sto S), and couples the plurality of layer vectors obtained for the plurality of layers in the order of the layers and generates a set of coordinate values of the plurality of nodes obtained in the 3D space as feature information of the inspected object (S).