Tucson, AZ, United States of America

Klaus Reinhard Freischlad


Average Co-Inventor Count = 1.9

ph-index = 5

Forward Citations = 113(Granted Patents)


Company Filing History:


Years Active: 1998-2018

Loading Chart...
15 patents (USPTO):Explore Patents

Title: Innovations of Klaus Reinhard Freischlad

Introduction

Klaus Reinhard Freischlad is a notable inventor based in Tucson, Arizona. He has made significant contributions to the field of surface inspection systems, holding a total of 15 patents. His work focuses on enhancing measurement capabilities through innovative technologies.

Latest Patents

One of his latest patents is the "Front quartersphere scattered light analysis," which describes a surface inspection system along with its related components and methods. This advanced system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features a light channel assembly designed to collect light reflected from the surface of the workpiece. Additionally, it incorporates a front collector and wing collectors to gather light scattered from the surface, significantly improving the system's measurement capabilities. The light channel assembly is equipped with a switchable edge exclusion mask and a reflected light detection system, enhancing the detection of reflected light.

Career Highlights

Throughout his career, Klaus has worked with prominent companies such as KLA-Tencor Corporation and Phase Shift Technology, Inc. His experience in these organizations has contributed to his expertise in developing cutting-edge technologies in surface inspection.

Collaborations

Klaus has collaborated with notable individuals in his field, including Richard Earl Bills and Neil Judell. These partnerships have further enriched his work and innovations.

Conclusion

Klaus Reinhard Freischlad's contributions to surface inspection technology demonstrate his commitment to innovation and excellence. His patents and collaborations reflect a deep understanding of the complexities involved in measurement systems.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…