This inventor holds 23 USPTO granted patents, primarily in Semiconductor Inspection. Top assignees: Nec Corporation, Nec Electronics Corporation, Renesas Electronics Corporation. Active years: 1988-2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Tokyo, JP (1988 - 2004)
- Kawasaki, JP (2009)
- Kanagawa, JP (2007 - 2012)
Company Filing History:
15 out of 36,735 
7 out of 2,467 
1 out of 7,659 
Years Active: 1988-2012
Areas of Expertise:
Title: Kiyoshi Nikawa: Pioneering Innovations in Semiconductor Inspection
Introduction
Kiyoshi Nikawa, based in Kanagawa, Japan, is a prominent inventor recognized for his significant contributions to the field of semiconductor inspection. With an impressive portfolio of 23 patents, he has played a vital role in advancing the technology used in the analysis and inspection of semiconductor chips.
Latest Patents
Among Kiyoshi's latest innovations are two groundbreaking patents. The first patent describes a method and apparatus for inspection and fault analysis of semiconductor chips. This system includes a mounting stage for LSI chips, where a test pattern generator provides a test pattern. An optical system modulates a laser beam, scanning and illuminating the LSI chip to facilitate detailed inspection. The IR-OBIRCH controller processes the image signals from the LSI chip using a lock-in amplifier to identify abnormal current routes.
The second patent outlines a method and apparatus for failure analysis of semiconductor chips. This technique involves the use of a photocurrent generation laser beam for fixed radiation and a heating laser beam to scan targeted regions of the chip. The SQUID fluxmeter detects current changes induced by the laser beams, allowing for effective failure analysis. This innovative approach enables visualization of defects, offering substantial advancements in semiconductor technology.
Career Highlights
Kiyoshi has built an impressive career, with notable tenure at esteemed organizations. He has worked with NEC Corporation and NEC Electronics Corporation, where he played a pivotal role in the development of cutting-edge technologies related to semiconductor analysis and inspection.
Collaborations
Throughout his career, Kiyoshi has had the opportunity to collaborate with talented individuals, including Toyokazu Nakamura and Yasuko Hanagama. These collaborations have undoubtedly contributed to the success of his projects and the innovations they produced.
Conclusion
In summary, Kiyoshi Nikawa stands out as a remarkable inventor in the semiconductor industry. His 23 patents illustrate his commitment to innovation and the advancement of technology. Through his latest inventions, he continues to influence the field of semiconductor inspection, paving the way for future developments in this critical area of technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile