Kiyoshi Murakami

Title: Kiyoshi Murakami: Innovator in X-ray Examination Technology

Introduction

Kiyoshi Murakami is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of X-ray examination technology, holding a total of 10 patents. His work focuses on improving the accuracy and efficiency of X-ray examination processes, particularly in relation to substrate inspections.

Latest Patents

Among his latest patents are the X-ray examination region setting method, X-ray examination apparatus, and X-ray examination region setting program. These inventions enable information on a connection wiring with a substrate of a mounted component to be accurately and easily inputted in an X-ray examination apparatus. In the teaching of substrate examination, when a user inputs a two-dimensional region of a component to be examined with respect to a visible light image of the substrate, three-dimensional data is generated for the relevant region. This data is then analyzed to acquire a center coordinate, the number, the number of rows, and the number of columns on a ball terminal connecting the component to the substrate. Results such as the center coordinate acquired in this manner may be displayed. The visible light image for the substrate is displayed in a display field of a screen, where a frame corresponding to a region acquired as an examination target is shown in accordance with the visible light image. Additionally, a frame corresponding to each solder ball is displayed based on the position and other factors acquired from the three-dimensional data.

Career Highlights

Kiyoshi Murakami is currently employed at Omron Corporation, where he continues to develop innovative solutions in the field of X-ray examination technology. His work has significantly advanced the capabilities of inspection apparatus used to inspect substrates during various production processes, including solder printing, component mounting, and soldering. Images of the substrate are taken both before and after these processes, allowing for the extraction of differences and identification of each component through differentiation and binarization processes.

Collaborations

Kiyoshi has collaborated with notable coworkers such as Teruhisa Yotsuya and Masato Ishiba, contributing to the advancement of technology in their field.

Conclusion

Kiyoshi Murakami's innovative work in X-ray examination technology has made a lasting impact on the industry. His patents and contributions continue to enhance the accuracy and efficiency of substrate inspections, showcasing his dedication to advancing technological solutions.