The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Sep. 02, 2005
Kiyoshi Murakami, Kyoto, JP;
Yasunori Asano, Ayabe, JP;
Takashi Kinoshita, Kyoto, JP;
Teruhisa Yotsuya, Kyoto, JP;
Kiyoshi Murakami, Kyoto, JP;
Yasunori Asano, Ayabe, JP;
Takashi Kinoshita, Kyoto, JP;
Teruhisa Yotsuya, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Preparation steps are taken before a substrate with components is inspected and a whole image of a standard substrate is prepared preliminarily and inspection areas are determined for target portions to be inspected on this whole image. At the time of the inspection, a camera is positioned corresponding to a target portion to obtain a target image and an area corresponding to the target image is extracted from the whole image and displacement values of this area are calculated relative to the target image. The setting position of the inspection area is corrected by the calculated displacement values and an inspection area is set on the target image based on the corrected coordinates.